Call for papers: SPIE Journal of Electronic Imaging
Joost van de Weijer
Universitat Autònoma de Barcelona
Centre de Visió per Computador
Edifici O, Campus UAB
08193 Bellaterra, Cerdanyola, Spain
University of Milan-Bicocca
Department of Informatics, System and Communication
Viale Sarca 336
20126 Milan, Italy
Call for Papers: Recognizing real-world materials in images is a challenging task due to the rich variations of lighting conditions, appearance, and surface properties. Color and textures are important components of material appearance.
The study of texture and material recognition have a long history in image analysis and computer vision. Recent works that deal with large collections of images taken from the Internet or that exploit large-scale machine learning techniques have renewed the interest in these topics. The most relevant insight is that features from other domains, such as object recognition, may achieve comparable or sometimes better performance than those achieved with features specially designed for texture and material classification. Moreover, while for some artificial materials color and texture are independent properties, for natural materials they are strongly related. Whether or not color information is useful for texture and material classification is still an open issue, especially “in the wild,” where imaging conditions such as lighting color and direction, orientation, sensor type, etc., are unpredictable.
This special section explores these topics by providing new insights for understanding color in texture and material recognition.
This special section covers different areas, including color science, computer vision, computer graphics, and machine learning. This is an open call for papers, soliciting original contributions in addition to selected works from the 2015 International Workshop on Color in Texture and Material Recognition (ICIAP-CTMR2015). Papers should address a wide range of theoretical and practical issues including, but not limited to:
Submissions due 15 February 2016.
All the paper accepted to the special issue can be retrieved at: